Centre for Microscopy, Characterisation and Analysis

THE NEXT WORKSHOP WILL TAKE PLACE ON: TBA - as required

If you are interested in attending a future workshop register your interest by completing the online registration form below.

WHO SHOULD ATTEND THIS WORKSHOP?

Researchers, PhD and Hons students in the physical sciences with TEM experience wishing to obtain images of crystalline materials with atomic resolution as part of their research project at the Centre for Microscopy, Characterisation and Analysis or other facilities.

WORKSHOP OUTLINE:

The principles and applications of high-resolution TEM will be reviewed through an initial lecture. Practical training on the microscope will introduce attendees to the alignment procedures and relevant software (Digital Micrograph) for obtaining high-resolution TEM images with a digital camera at CMCA. Basic image analysis and interpretation will be included in the workshop. There will be opportunities for attendees to discuss the use of high-resolution TEM in their research project with a member of Centre staff.

WHAT SHOULD YOU KNOW BEFORE THE WORKSHOP?

It will be assumed that attendees have a basic knowledge of crystal structures and crystallography. Attendees are expected to be familiar with the basic operation of a TEM and the TEM aspects of their own research project before attending the course. You must have completed the TEM training course before you can attend the HREM workshop. It is also recommended that you gain some experience operating a TEM before attending the workshop.

WHAT WILL YOU LEARN ON THIS WORKSHOP?

Attendees will learn how to obtain and interpret high-resolution TEM data, including –

* How to set up and align the microscope for high-resolution imaging;
* How to adjust the objective stigmation and image focus using Fourier Transforms of high-resolution images;
* How to obtain images at atomic resolution;
* Basic image interpretation (e.g. is the sample crystalline or amorphous?);
* Basic image analysis (measuring planar spacings and interplanar angles);
* Introduction to image simulation;
* Sample requirements for high-resolution TEM (but not sample preparation methods).

WHAT IS NOT INCLUDED IN THIS WORKSHOP?

Basic information on TEM operation is covered in the TEM training course and is not included in this workshop. Crystallography and information related to the understanding of crystal structures is not included in this workshop (and it will be assumed that attendees already have a basic understanding of these topics). Detailed information on the theory of high-resolution imaging and image simulation is not included in the workshop.

RELATED TRAINING OPPORTUNITIES:

Other TEM-related workshops currently include –

* TEM training course (for basic TEM operation);
* Electron diffraction (for crystal structure analysis);
* Energy-filtered TEM (EFTEM) (for element distribution imaging);
* Electron energy-loss spectroscopy (for local composition and chemistry);
* X-ray microanalysis by TEM (for compositional analysis);
* Scanning TEM imaging (including BF and HAADF imaging);
* Sample preparation for the physical sciences (appointments can also be made with Dr Martin Saunders or Dr Alexandra Suvorova to discuss your specific requirements).

Appointments to discuss individual projects, project planning, etc. can be made directly with Centre staff (Physical Sciences – Dr Martin Saunders).

ADDITIONAL RESOURCES & INFORMATION:

Copies of lecture notes and supporting documentation will be made available in electronic form before the course. Attendees are expected to be familiar with the basic principles and applications of high-resolution TEM before attending the course. Many TEM-related books including high-resolution TEM information can be found in the UWA library. The following are recommended –

* D. Shindo, K. Hiraga (1998) High-resolution electron microscopy for materials science, Springer.
* J.C.H. Spence (2003) High-resolution electron microscopy, Oxford University Press.

Attendees are recommended to download and read the following review article (and any of the included references) before attending the workshop –

* J. C. H. Spence, The future of atomic resolution electron microscopy for materials science, Materials Science and Engineering: R: Reports, V26 (Issues 1-2), 26 Oct 1999, Pages 1-49. To download article, click here (UWA only).

The library also houses a set of DVD recordings of microscopy workshops run by the Microscopy Society of America.

WHEN AND WHERE IS THE WORKSHOP HELD?

The workshop is held at the Centre for Microscopy, Characterisation and Analysis at The UWA. The workshop will run as demand requires, which is likely to be several times per year.

HOW DO I REGISTER & WHAT DOES IT COST?

Places on this workshop are available to students and researchers with a demonstrated need to use high-resolution TEM in their research.

You can register your interest in attending the next workshop by completing the online registration form

Places are limited and preference will be given to registered CMCA Users. Your place will be confirmed in advance of the next scheduled workshop.

To find out about becoming a CMCA User contact the CMCA Manager, Jeanette Hatch.

The workshop is free to all current registered Users. All non-registered participants will be allocated a place only if maximum numbers are not reached, and a cost of $220 (inc. GST) will apply. Any enrollee who fails to cancel their attendance more than 24h in advance will be charged a $55 (inc. GST) no show fee.

DOWNLOAD THIS INFORMATION SHEET:

HREM_workshop.pdf

Updated 04 May 2007 13:38
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High resolution TEM workshop