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Scanning Electron Microscopes
Instrument | Description | Contact Info |
|
Zeiss 1555 VP-FESEM
|
High resolution field emission SEM. 0.1-30kV, inlens, BSD, SE, CL, EDS and variable pressure (up to 133 Pa, dry only) capabilities.
|
Room G84, 6488 8066 - Crawley CMCA contact: Prof Brendan Griffin or Dr Peta Clode |
|
JEOL 6400 SEM
|
Optimised for full standardised, quantitative EDS analysis. 5-30kV, SE, BSD and EDS capabilities
|
Room G77, 6488 8055 - Crawley CMCA contact: Dr Janet Muhling |
|
JEOL 6400R MICROPROBE
|
Optimised for WDS analysis. This microprobe is equipped with an integrated WDS-EDS system providing quantitative elemental (including trace element) analysis. Conventional SE and BSD imaging is also available.
|
Room G82, 6488 8084 - Crawley CMCA contact: Dr Janet Muhling |
|
Phillips XL30 ESEM
|
Optimised for routine and variable pressure SEM imaging. SE, BSD and variable pressure (up to 10 torr, dry or wet) imaging, plus hot stage (up to 1000C) and peltier cooled stage.
|
Room G76, 6488 8083 - Crawley CMCA contact: Prof Brendan Griffin or Dr Peta Clode |
